Journal of The Electrochemical Society · 1993 · 14 citations · 0 references
Natural SciencesChemistryMaterials ScienceInorganic ChemistryMaterials ChemistrySpectroscopyInorganic SpectroscopyLuminescent MaterialsRare-earth-doped MaterialsThin Film Optical PropertiesX-ray CrystallographyX-ray SpectroscopyExtended X-ray Absorption Fine StructureLanthanide-doped MaterialsLocal Electronic StructureLocal StructureRare-earth-doped Host MaterialsRare-earth-doped Luminescent MaterialsRare-earth-doped Thin FilmsX-ray Absorption Spectroscopy
Extended x‐ray absorption fine structure (EXAFS) was used to determine the local structure of luminescent centers in electroluminescent thin films: in Mn‐ and Tm‐doped zinc sulfide as well as in Tb‐ and Ce‐doped calcium sulfide and strontium sulfide. EXAFS measurements were carried out using the electron‐yield detection method. While Mn enters a substitutional site, the larger Tm ion is associated with oxygen and forms polycations. In the rare‐earth dopants replace Ca2+ ions in the lattice and no oxygen was found in their environment.