Extended X‐ray Absorption Fine Structure Studies of Luminescent Centers in II – VI Thin Films

Abstract

Extended x‐ray absorption fine structure (EXAFS) was used to determine the local structure of luminescent centers in electroluminescent thin films: in Mn‐ and Tm‐doped zinc sulfide as well as in Tb‐ and Ce‐doped calcium sulfide and strontium sulfide. EXAFS measurements were carried out using the electron‐yield detection method. While Mn enters a substitutional site, the larger Tm ion is associated with oxygen and forms polycations. In the rare‐earth dopants replace Ca2+ ions in the lattice and no oxygen was found in their environment.