In situ characterization of stoichiometry for the buried SiOx layers in SiOx/SiO2 superlattices and the effect on the photoluminescence property - Concepedia

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In situ characterization of stoichiometry for the buried SiOx layers in SiOx/SiO2 superlattices and the effect on the photoluminescence property

27

Citations

17

References

2004

Year

Kyung Joong Kim, Dae Won Moon, Seung-Hui Hong, Suk‐Ho Choi, Moon-Seung Yang, Ji-Hong Jhe, Jung H. Shin

Thin Solid Films

Materials SciencePhotoluminescenceEngineeringPhotoluminescence PropertyApplied PhysicsBuried Siox LayersSiliceneSiox/sio2 SuperlatticesSilicon On InsulatorOptoelectronics

References

	Year	Citations

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