IEEE Transactions on Plasma Science · 2011 · 71 citations · 18 references
Natural SciencesMaterials EngineeringMaterials SciencePolymer EngineeringPolymer MaterialsThin FilmsComposite MaterialsPolymer CharacterizationPolymer CompositesPolymer PhysicsPolymer Thin FilmsBreakdown StrengthElectrical Breakdown StrengthElectrical Insulation MaterialsPolyethylenePolymer Insulation MaterialsPolymeric InsulationRise TimeThickness Effects
The thickness effect on electric breakdown strength ( <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BD</sub> ) of four kinds of polymers under nanosecond pulses is investigated. The polymers are polyethylene, PTFE, PMMA, and nylon. The test samples are 0.5-3.5 mm in thickness (d) and are immersed in transformer oil. The nanosecond pulse is based on a Tesla-type generator, TPG200, which is with values of pulsewidth of 8.5 ns and rise time of 1.5 ns. The experimental results show that <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BD</sub> is 1-2 MV/cm and decreases as <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">d</i> increases. The dependence of <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BD</sub> on <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">d</i> is analyzed with the Weibull statistical distribution. It is concluded that log <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">E</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BD</sub> versus log d is linear. By replotting the experimental data and by comparing with Martin's results, it is found that the slope for the linear dependence is about -1/8. With this conclusion, the breakdown probability is researched. It is shown that, to get a breakdown probability as low as 0.5%, the applied field should be decreased to about half of E <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BD</sub> .
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J. C. Martin · Proceedings of the IEEE · 1992 · 175 citations
Pulsed power-driven high-power microwave sources
S. D. Korovin, S. D. Polevin, I.V. Pegel et al. · Proceedings of the IEEE · 2004 · 126 citations