Publication | Closed Access
Strain and Texture in Al-Interconnect Wires Weasured by X-Xay Microbeam Diffraction
36
Citations
5
References
1999
Year
Materials ScienceMaterials EngineeringAluminium NitrideX-xay Microbeam DiffractionEngineeringSevere Plastic DeformationMechanical EngineeringApplied PhysicsX-ray DiffractionSolid MechanicsMicrostructure-strength RelationshipAl-interconnect WiresMechanics Of MaterialsMicrostructureHigh Strain Rate
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