Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques - Concepedia

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Dependence of the sheet resistance of indium-tin-oxide thin films on grain size and grain orientation determined from X-ray diffraction techniques

254

Citations

16

References

1999

Year

A. K. Kulkarni, Kirk H. Schulz, Tae Seop Lim, Md. Irfan Khan

Thin Solid Films

Materials ScienceIndium-tin-oxide Thin FilmsMaterial AnalysisEngineeringOxide ElectronicsGrain OrientationApplied PhysicsMaterial PerformanceThin FilmsGrain SizeThin Film ProcessingMicrostructure

References

	Year	Citations

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