Automated optical inspection system for analogical resistance type touch panel

Yen‐Chung Chen, Jiun-Hung Yu, Mu-ChiauXie, Fang‐Jung Shiou

International Journal of the Physical Sciences · 2011 · 10 citations · 10 references

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Abstract

The touch panel is the most important and promising technical product nowadays. Automated optical inspection (AOI) technology provides objective measurement, shorter production period and better production quality. The purpose of this paper is to develop an automated optical inspection system for analogical resistance type touch panel. This system integrates mechanism, electrical control and machine vision, and applies digital image processing method, such as Fourier transform, edge detection, thresholding, morphology, particle analysis, etc., to inspect defect of the type touch panel. Finally, the experimental results from touch panel samples show that the automated inspection system can detect and classify defects efficiently.   Key words: Fourier transform, touch panel, automated optical inspection (AOI), image processing.

References

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