Imaging Shear in Sliding Charge-Density Waves by X-Ray Diffraction Topography

Y. Li, Serge G. Lemay, Jonathan H. V. Price, Katarina Cicak, Kevin M. O'neill, K. L. Ringland, K. D. Finkelstein, J. D. Brock, Robert Thorne

Physical Review Letters · 1999 · 24 citations · 15 references

Concepts

Abstract

We have imaged the electric-field-dependent structure of charge-density waves (CDWs) in ribbonlike ${\mathrm{NbSe}}_{3}$ single crystals by monochromatic x-ray topography. Below the depinning threshold ${E}_{T}$ the CDW is well correlated. Just above ${E}_{T}$, the CDW shears along longitudinal steps in crystal thickness associated with small-angle grain boundaries, and at high fields transverse correlations recover. These results demonstrate x-ray topography as an effective probe of superlattice structure and with earlier transport measurements establish that extrinsic sources dominate CDW plasticity observed in ${\mathrm{NbSe}}_{3}$.

References

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