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Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays

Geometric ModelingAdaptive OpticDeformed SurfacesEngineeringMicroscopySynthetic Aperture RadarOptic DesignGeometrical OpticApplied PhysicsComputational ImagingFreeform OpticDirect TransferGeometrical AberrationInstrumentationOptical System AnalysisMicrometer Resolutions