Publication | Closed Access
Large Barkhausen discontinuity of Co-Fe-Si-B amorphous films sputtered on polymer substrate
10
Citations
8
References
1996
Year
EngineeringLarge Barkhausen DiscontinuityMagnetic ResonanceSilicon On InsulatorMagnetismMagnetic Data StorageMagnetic Thin FilmsThin Film ProcessingMaterials ScienceMaterials EngineeringPhysicsCo-fe-si-b FilmsDc MagnetronSemiconductor MaterialCo-fe-si-b Amorphous FilmsMicroelectronicsMagnetic MediumSpintronicsSurface ScienceApplied PhysicsCondensed Matter PhysicsPolymer SubstrateThin FilmsMagnetic PropertyAmorphous Solid
Co-Fe-Si-B films have been prepared using a roll coater and DC magnetron sputtering system onto a polyethylene terephthalate substrate. This thin film exhibited an excellent uniaxial anisotropy introduced by an asymmetric thermal shrinkage of the substrate. Reversal with a single large Barkhausen pulse has been observed in thin film structure 1 mm by 50 mm by 0.65 /spl mu/m. Closure domains have been clearly identified at the film ends. The threshold for the reversal is the coercive force. The reason for reversal with a single Barkhausen jump is that the long narrow film geometry has essentially zero demagnetizing field over most of the film. Once the walls start to move through the center portion of the film, there is nothing to stop them so the reversal proceeds with a single large Barkhausen pulse.
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