Applied Physics Letters · 1981 · 22 citations · 5 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsElectron MicroscopyHot Spot AnalysisSuperconducting MaterialsSuperconducting Thin FilmsCritical TemperatureLow-temperature SuperconductorsSuperconducting Properties
Low-temperature scanning electron microscopy can be used for the direct observation of hot spots in a superconductor. Experiments performed at 2.10 K with tim films demonstrating the method are reported.
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Liquid-helium stage in a scanning electron microscope
Peter Stöhr, R. P. Huebener · Cryogenics · 1979 · 13 citations