Formation of hot spots in a superconductor observed by low-temperature scanning electron microscopy

R. Eichele, H. Seifert, R. P. Huebener

Applied Physics Letters · 1981 · 22 citations · 5 references

Concepts

Abstract

Low-temperature scanning electron microscopy can be used for the direct observation of hot spots in a superconductor. Experiments performed at 2.10 K with tim films demonstrating the method are reported.

References

5