Publication | Closed Access
X-ray powder diffraction data for indium nitride
76
Citations
3
References
1999
Year
Materials ScienceX-ray CrystallographyX-ray SpectroscopyEngineeringCrystalline DefectsX-ray DiffractionApplied PhysicsWurtzite-type Unit CellIndium NitrideSynchrotron RadiationAutomated Bragg-brentano DiffractometerCrystallographyMicrowave Plasma SourceMicrostructure
X-ray powder diffraction pattern for InN synthesized using a microwave plasma source of nitrogen is reported. The data were obtained with the help of an automated Bragg-Brentano diffractometer using Ni-filtered Cu K α radiation. The lattice parameters for the wurtzite-type unit cell are a o =3.5378(1) Å, c o =5.7033(1) Å. The calculated density is 6.921±0.002 g / cm 3 .
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