Characterization of the Free‐Carbon Phase in Si‐C‐N Ceramics: Part II, Comparison of Different Polysilazane Precursors

Abstract

The excess carbon of various polysilazane precursors with varying carbon contents was investigated using 13 C MAS NMR, Raman and ESR spectroscopies, and microwave conductivity measurements. Microstructure characterization was investigated using TEM. The collected data were compared with those from a previous study on the same precursor. This study focused on the distribution and appearance of the free‐carbon phase. Although the spectroscopic techniques showed no differences in the structure of the free‐carbon phase, a clear distinction between the various precursors was found using microwave conductivity and high‐resolution TEM imaging.