Theoretical and experimental X‐ray photoelectron spectroscopy investigation of ion‐implanted nafion

Abstract

Abstract The membrane properties of a Nafion surface can be modified by ion implantation with N + or F + . The results are presented of an X‐ray photoelectron spectroscopy (XPS) study of implanted surfaces. For the interpretation of the XPS spectra, calculations using a semiempirical quantum chemical formalism (AM1) have been applied, in conjunction with a charge‐potential model, to predict the C 1s core electron binding energies. © 2003 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 42: 551–556, 2004