A built-in self-repair analyzer (CRESTA) for embedded DRAMs

Abstract

A new practical built-in self-repair analyzer algorithm for embedded DRAMs (e-DRAM) achieves 100% detection ability of the repairable chips with 1% area penalty of the target 32 Mb embedded DRAM by 4 parallel analyzers. It works at as fast as 500 MHz, well beyond targeted e-DRAMs' maximum operation speed around 200 MHz+.