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Characterization of epitaxial GaAs MOS capacitors using atomic layer-deposited TiO2/Al2O3 gate stack: study of Ge auto-doping and p-type Zn doping

DOIFull Paper Access

14

Citations

27

References

2012

Year

Goutam Kumar Dalapati, T.K.S. Wong, Yang Li, Ching Kean Chia, Anindita Das, C. Mahata, Han Gao, Sanatan Chattopadhyay, M. K. Kumar, Debbie Hwee Leng Seng,
Nanoscale Research Letters

References

YearCitations

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