IEEE Transactions on Electromagnetic Compatibility · 2007 · 44 citations · 10 references
EngineeringElectrical EngineeringAnalog ElectronicsElectromagneticsInstrumentationAnalog InstrumentationAnalog Integrated CircuitsElectromagnetic CompatibilityOperational AmplifiersSignal AmplificationSignal ConditioningAnalog Signal ConditioningDemodulationElectromagnetic InterferenceLow-frequency ModelingNoise In Operational AmplifiersOperational Amplifier CircuitsOperational Amplifier Small-signal ModelsSmall-signal Equivalent Circuit Models
<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> Circuits based on operational amplifiers (OPAMPs) are susceptible to electromagnetic interference (EMI) in the radio-frequency range due to the AM demodulation produced by nonlinearity of internal transistors. Such a phenomenon produces demodulated signals in the low-frequency range. This paper presents a model to predict the susceptibility of analog signal-conditioning circuits, based on a few test parameters, while ignoring the internal structure of OPAMPs involved in the circuit. The method has been experimentally tested in two applications: 1) test of simple instrumentation adapter circuits and 2) predictions of susceptibility of an amplifier for an electret microphone, tested according to EN55020. </para>
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