Publication | Closed Access
Large Uniaxial Magnetic Anisotropy of Co–Pt Perpendicular Films Induced by Lattice Deformation
28
Citations
11
References
2007
Year
Magnetic PropertiesEngineeringMagnetoelastic MaterialsMagnetic MaterialsLattice DeformationMagnetismMagnetic Thin FilmsThin Film ProcessingAnisotropic MaterialMaterials ScienceThickness DependencePhysicsMagnetic MaterialFilm ThicknessRu Seed LayersNatural SciencesCondensed Matter PhysicsApplied PhysicsThin FilmsMagnetic Property
A study of the thickness dependence of the uniaxial magnetic anisotropy K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> of Co-Pt perpendicular films deposited on Ru seed layers was extended over a wide range of Pt content from 10 to 30 at%, to further investigate the origin of the significant increase in K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> on reducing the film thickness, which was previously reported for Co <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">80</sub> Pt <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">20</sub> /Ru films. K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> increased significantly as the thickness decreased in all series of films with various Pt content. The rate of increase of K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> with reducing thickness became increasingly large as the Pt content decreased. It should be noted that the K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> of 2-nm-thick films was an almost constant 2times10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">7</sup> erg/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sup> over the range of Pt contents studied, although K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> was maximized at 25-30at%Pt content for films thicker than 5 nm. Experimental results suggest that the increase in K <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">u</sub> on reducing the thickness was mostly related to a reduction of the hcp Co-Pt lattice c/a ratio
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