Crystallographic Texture and Thermal Conductivity of Zirconia Thermal Barrier Coatings Deposited on Different Substrates

Abstract

The crystallographic texture and thermal conductivity of zirconia coatings deposited by electron beam evaporation on a variety of substrates have been measured. It was found that the thermal conductivity of coatings deposited at the same temperature was independent of whether they were deposited on polycrystalline alumina, single‐crystal sapphire, single‐crystal zirconia, or fused silica. The room‐temperature thermal conductivity of the coatings deposited at 700°C was 0.32 W/(m·K), increasing to 1.36 W/(m·K) for coatings deposited at 1150°C. Similarly, the crystallographic texture was also independent of the substrate and had a (111) fiber texture at 700° and 900°C, switching to a (200) fiber texture by 1050°C. The exception was the coating deposited at 1150°C on (111) single‐crystal zirconia which was epitaxial and exhibited a thermal conductivity of 2.46 W/(m·K). It is concluded that the properties of zirconia thermal barrier coatings are determined by the growth conditions rather than those associated with nucleation on the underlying substrate.