Publication | Closed Access
Analysis of low frequency memory and influence on solid state HPA intermodulation characteristics
39
Citations
5
References
2002
Year
Unknown Venue
Theoretical AnalysisElectrical EngineeringLow Frequency MemoryEngineeringRf SemiconductorPhysicsHigh-frequency DeviceNonlinear CircuitElectronic EngineeringBias Temperature InstabilityMulti-channel Memory ArchitectureHfet Power AmplifiersHfet CaseSemiconductor MemoryMicroelectronicsElectromagnetic CompatibilityElectronic Circuit
A theoretical analysis using two-tone simulations and practical measurements of low frequency memory impact on third order intermodulation (IM3) on HBT as well as HFET power amplifiers is carried out. A particular emphasis is placed on the thermal origin for the HBT case and electrical origin for the HFET case of these low frequency nonlinear phenomena.
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