Journal of Physics C Solid State Physics · 1983 · 88 citations · 15 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsElectronic MaterialsMaterials PhysicsCarrier TransportElectron TransportPhotoelectron SpectroscopySemiconductor PhysicsSurface PhysicsX-ray Photoelectron SpectroscopyAngle-resolved Photoelectron SpectroscopyAngle-resolved Photoemission SpectroscopyAngle-resolved X-ray Photoelectron SpectroscopyCarrier Transport MechanismsElectron Transport In SolidsFermi LevelFermi SurfaceIndirect Band Gap
The authors report measurements of angle-resolved photoemission and of transport properties for the same samples of nearly stoichiometric TiS2, and of Ti1.05S2. It is shown that the carrier densities derived from the two techniques are consistent, and the geometries of the Fermi surfaces are mapped out. The data also show that there is an indirect gap of 0.3+or-0.1 eV between the S p and Ti d bands, for both materials.
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