Proceedings of the Physical Society · 1948 · 23 citations · 12 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsSolid State PhysicsThin FilmsDielectric MaterialsDielectric PropertiesDielectricsElectrical ConductivityThin Film Electrical PropertiesThin-film MaterialsDielectric ConstantDielectric StrengthElectrical Breakdown StrengthElectron Mean Free PathMean Free PathMean Free Path DependenceThin-film Dielectrics
An attempt is made to verify the rise in electric strength predicted by Frohlich's theory as the thickness of the dielectric specimen approaches the electronic mean free path. The results obtained on a number of materials both crystalline and amorphous are given and discussed in relation to this theory.
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