XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positions - Concepedia

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XPS investigation of preferential sputtering of S from MoS2 and determination of MoSx stoichiometry from Mo and S peak positions

449

Citations

19

References

1999

Year

Mark Baker, R. Gilmore, Cristina Lenardi, W. Gissler

Applied Surface Science

Materials ScienceXps InvestigationMaterials EngineeringPreferential SputteringEngineeringMaterial AnalysisIi-vi SemiconductorTransition Metal ChalcogenidesOxide ElectronicsSurface ScienceApplied PhysicsMosx Stoichiometry

References

	Year	Citations

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