Measurement of aluminium concentration in GaAlAs epitaxial layers by double-axis X-ray diffraction - Concepedia

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Measurement of aluminium concentration in GaAlAs epitaxial layers by double-axis X-ray diffraction

18

Citations

5

References

1988

Year

B. K. Tanner, S.J. Miles, George Peterson, R. N. Sacks

Materials Letters

Materials ScienceAluminium NitrideEngineeringApplied PhysicsGaalas Epitaxial LayersSemiconductor MaterialAluminium ConcentrationMolecular Beam EpitaxyDouble-axis X-ray DiffractionEpitaxial GrowthMicrostructure

References

	Year	Citations

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