Publication | Closed Access
Self-Consistent Results for<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>n</mml:mi></mml:math>-Type Si Inversion Layers
1.2K
Citations
16
References
1972
Year
Numerical AnalysisDevice ModelingElectrical EngineeringMath Xmlns-Type Inversion LayersEngineeringPhysicsNanoelectronicsSurface ScienceApplied PhysicsSelf-consistent ResultsInverse ProblemsEnvelope Wave FunctionUnified Field TheorySemiconductor Device FabricationSilicon On InsulatorMicroelectronicsSemiconductor Device
Self-consistent results for energy levels, populations, and charge distributions are given for $n$-type inversion layers on $p$-type silicon. Quantum effects are taken into account in the effective-mass approximation, and the envelope wave function is assumed to vanish at the surface. Approximate analytic results are given for some special cases. Numerical results are given for representative surface orientations, bulk acceptor concentrations, inversion-layer electron concentrations, and temperatures.
| Year | Citations | |
|---|---|---|
Page 1
Page 1