Physical review. B, Solid state · 1972 · 1.2K citations · 16 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSurface ScienceApproximation MethodsDevice CharacterizationDevice SimulationSemiconductor InterfacesSemiconductor SurfacesSurface PhysicsCharge State DistributionsEffective MassEffective Mass ApproximationEnvelope Function ApproximationSemiconductor Device ModelingSiliconSilicon Surface ScienceSurface States
Self-consistent results for energy levels, populations, and charge distributions are given for $n$-type inversion layers on $p$-type silicon. Quantum effects are taken into account in the effective-mass approximation, and the envelope wave function is assumed to vanish at the surface. Approximate analytic results are given for some special cases. Numerical results are given for representative surface orientations, bulk acceptor concentrations, inversion-layer electron concentrations, and temperatures.
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P. J. Boddy · Surface Science · 1966 · 800 citations
Negative Field-Effect Mobility on (100) Si Surfaces
F. F. Fang, W. E. Howard · Physical Review Letters · 1966 · 525 citations
Mino Green, Julius Klerer · Journal of The Electrochemical Society · 1970 · 383 citations