A memory cell with single-electron and metal-oxide-semiconductor transistor integration

Abstract

A single-electron transistor memory cell with metal-oxide-semiconductor field-effect transistor sensing has been fabricated in silicon-on-insulator material. The single-electron transistor, coupled to a memory node, is defined in the upper silicon layer. The memory node forms the gate of a metal-oxide-semiconductor field-effect transistor with its channel in the substrate silicon. At 4.2 K, there are two different states of the memory-node voltage, separated by the single-electron transistor Coulomb gap. These states are sensed at high-current output levels by the metal-oxide-semiconductor transistor. The metal-oxide-semiconductor transistor current also shows evidence of gate-dependent conductance oscillations in the coupled single-electron transistor.