Journal of Applied Crystallography · 2014 · 17 citations · 44 references
Thin Mica CrystalEngineeringSurface NanotechnologyChemistryNeutron ReflectionChemical EngineeringInterface ChemistryIntensity SummationSurfactant SolutionMaterials ScienceChemisorptionAdsorptionCationic Dichain SurfactantSurface CharacterizationSurface ChemistrySurface AnalysisSurface ScienceApplied PhysicsMaterials CharacterizationInterfacial Phenomena
Neutron reflection from the important mineral mica at the solid/liquid interface is presented here using a new approach – a very thin mica crystal supported on a silicon substrate. This approach avoids the problems of crystal defects and surface undulations that have hindered previous work. The use of mica as a reflectivity substrate is important as it is a model surface, which is atomically smooth with a high structural charge. In this work the mica/water interface is fully characterized. In particular, a characteristic double critical edge is observed, arising from the higher scattering length densities of the mica and D 2 O subphase relative to the silicon support. The experimental data are modelled using a combined approach: conventional amplitude summation (matrix method) for the thin layers and reflected intensity summation with attenuation terms for the thick layers of mica and hydrocarbon adhesive. Reflection data from the adsorption of the dichain cationic surfactant didodecyldimethylammonium bromide (DDAB) to the surface of muscovite mica from aqueous solution are also presented. It is found that, at twice the critical micelle concentration, a bilayer of DDAB with a thickness of 24 Å is observed, containing essentially no water. Its partial removal by washing and ion exchange is also presented.
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Neutron scattering lengths and cross sections
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