Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy - Concepedia

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Surface modification of Sylgard 184 polydimethylsiloxane by 254nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

53

Citations

24

References

2008

Year

Emanuel Waddell, Stephen Shreeves, Holly Carrell, Christopher C. Perry, Branden Reid, J.M. McKee

Applied Surface Science

Materials ScienceExcimer RadiationEngineeringSurface FunctionalizationPolymer ScienceSurface ScienceSurface ModificationSylgard 184Chemistry

References

	Year	Citations

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