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On the validity of unintentional doping densities extracted using Mott–Schottky analysis for thin film organic devices

Chemical EngineeringElectronic DevicesEngineeringOrganic ElectronicsApplied PhysicsOrganic SemiconductorSemiconductor MaterialUnintentional Doping DensitiesThin Film Process TechnologyThin FilmsCharge Carrier TransportMott–schottky Analysis