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Photoluminescence study of excess carrier spillover in 1.3 μm wavelength strained multi-quantum-well InGaAsP/InP laser structures
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Citations
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References
1995
Year
Categoryquantum ElectronicsEngineeringLaser ApplicationsLaser MaterialOptoelectronic DevicesSemiconductorsOptical PropertiesExcess Carrier RedistributionHigh LevelSpace Charge BarriersCompound SemiconductorPhotonicsQuantum SciencePhotoluminescencePhysicsQuantum DeviceOptoelectronic MaterialsPhotoluminescence StudyμM WavelengthApplied PhysicsQuantum Photonic DeviceExcess Carrier SpilloverOptoelectronics
Photoluminescence of 1.3 μm wavelength strained multiple quantum well InGaAsP/InP laser structures has been used to understand the excess carrier redistribution between the quantum well and waveguide regions at a high level of excitation. A model is developed to describe the experimental results. The model suggests that space charge barriers play a significant role in the electron confinement in quantum wells at the high excitation range typical of laser diode operation.
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