Magnetic properties of thin Ni films measured by a dc SQUID-based magnetic microscope

K.E. Andreev, A.M. Tishin, J. Bohr

Physical review. B, Condensed matter · 1997 · 29 citations · 25 references

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Abstract

We have applied a scanning HTS (high-temperature superconductor) dc SQUID (superconducting quantum interference device) -based magnetic microscope to study the magnetic properties of Au/Ni/Si(100) films in the thickness range from 8 to 200 \AA{} at T=77 K. A one-domain structure with in-plane orientation of the magnetic moment was found for film thicknesses exceeding 26 \AA{}. A drastic decrease of the magnetization of the film was detected when the thickness is less than 26 \AA{}.

References

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