Change of lattice distortion images in X-ray topography with resonant scattering in the Laue case

Abstract

Plane-wave topographs of X-rays for the GaAs 200 reflection were recorded using synchrotron radiation near the K-absorption edges of Ga and As. The topographic contrasts caused by lattice defects were changed by tuning the X-ray energy to four typical resonant scattering conditions. A sharp image of a lattice defect was observed when the Borrmann effect disappeared. When the Borrmann effect was conspicuous, an image of lattice distortion around a dislocation was observed, and its contrast was reversed by changing the phase factor of the resonant scattering. The lattice distortion image and its contrast reversal are discussed based on the resonant scattering dynamical theory by introducing the edge-dislocation model. The results show that topographs using resonant scattering should be a new characteristic method in synchrotron topography.