Narrow photoluminescence peaks from localized states in InGaN quantum dot structures

Abstract

Microscopic photoluminescence spectra were measured for self-assembled InGaN quantum dots (QDs) grown by metalorganic chemical vapor deposition. A thin aluminum layer with 400 nm square apertures was formed on the sample surface to reduce the number of QDs measured. We observed very sharp peaks whose spectral linewidths were typically 170 μeV at 3.5 K, the linewidth being limited by spectral resolution. Such sharp lines were not observed in similar experiments on a reference sample having single InGaN quantum well structure. These experimental results suggest that excitons are strongly confined in our InGaN QD structure.