Review of Scientific Instruments · 2003 · 256 citations · 9 references
EngineeringElectrical EngineeringMaterials ScienceElectromagneticsMetallic MaterialsMicrowave EngineeringAntenna MeasurementElectrical ConductivityElectromagnetic CompatibilityMicrowave MaterialsMicrowave MeasurementsShielding MaterialsCharacterization Of Microwave MaterialsElectromagnetic InterferenceElectromagnetic ShieldingElectromagnetic Shielding MaterialsShieldingShielding EffectivenessShielding Effectiveness TestingShielding Efficiency
A flanged coaxial line sample holder was designed and connected to a vector network analyzer (50 MHz–13.5 GHz) to measure S‑parameters and EMI shielding efficiency of copper and polyaniline, and the results were compared with ASTM D4935‑99 and dc‑conductivity simulations while analyzing absorption and reflection contributions. The EMI SEs measured by the two experimental techniques agree in the 50 MHz–1.5 GHz range.
We have designed and manufactured a flanged coaxial line as a sample holder for measuring the electromagnetic interference (EMI) shielding efficiency (SE) of planar materials in broadband frequency ranges up to 18 GHz. Connecting the samples holder to a vector network analyzer (50 MHz⩽M⩽13.5 GHz), we measured the S (scattering)-parameters and the EMI SE of copper (Cu) as a highly conducting material and emeraldine salt form of polyaniline (PAN–ES) as an intermediately conducting one. The measured EMI SEs of the materials from 50 MHz to 13.5 GHz were compared with those obtained from the conventional ASTM D4935-99 method and theoretical simulation using dc conductivity. We observed that the EMI SEs measured by using both experimental techniques agree with each other in the common frequency range (50 MHz∼1.5 GHz). The EMI shielding characteristics of samples such as the contribution of absorption and reflection to total EMI SE were analyzed through the measured S parameters.
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<i>Classical Electrodynamics, 3rd ed</i>.
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Introduction to electromagnetic compatibility
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