Dependence of Argon<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>K</mml:mi></mml:math>-Shell Vacancy Production on the Electronic Structure of Swift Heavy Projectiles

Loren M. Winters, James MacDonald, M. D. Brown, T. Chiao, L. D. Ellsworth, E. W. Pettus

Physical review. A, General physics · 1973 · 56 citations · 20 references

Concepts

Abstract

Thin gas targets of argon were bombarded with C, N, O, and F projectiles of various incident charge states at energies from 1 to 2 MeV/amu. Argon $K$ x rays were observed with a Si(Li) detector, and x-ray-production cross sections were obtained. For a given-energy projectile, the cross sections decrease approximately exponentially as the number of electrons bound to the incident projectile increases from 0 to 3. For three or more electrons, the measured cross sections change very little. Hartree-Fock calculations of fluorescence yields as a function of target configuration were used to obtain argon $K$-shell vacancy-production cross sections. Target configurations were chosen by comparing the experimental argon $K\ensuremath{\alpha}$ and $K\ensuremath{\beta}$ x-ray energies and $\frac{K\ensuremath{\beta}}{K\ensuremath{\alpha}}$ relative intensities with the values obtained by Hartree-Fock calculations. For projectiles with more than one electron, the vacancy-production cross sections scale as the square of projectile nuclear charge as expected for Coulomb ionization, but the absolute magnitudes of the cross sections do not agree with Coulomb-ionization results. For projectiles with 0 to 1 electron, however, Coulomb ionization alone cannot explain the observed cross sections. Charge exchange from the argon $K$ shell to projectile bound states has been proposed as a significant vacancy-producing mechanism for collisions involving highly charged projectiles. Although calculations of the charge-exchange cross sections are in reasonable relative agreement with the data, additional vacancy-producing mechanisms cannot be ignored.

References

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