Publication | Closed Access
The doping method in quantitative X-ray diffraction phase analysis. Addendum
19
Citations
0
References
1983
Year
X-ray CrystallographyMaterials ScienceDoping MethodX-ray SpectroscopyEngineeringPhysicsCrystal MaterialNatural SciencesCrystal Growth TechnologyX-ray DiffractionApplied PhysicsCondensed Matter PhysicsElectron DiffractionWeight FractionCrystallographyCrystal Structure DesignSpecific CaseX-ray Imaging
A specific case of the doping method [Popović & Gržeta-Plenković (1979). J. Appl. Cryst. 12, 205–208] is elaborated, in which the weight fraction of a crystalline component in the multicomponent system can be determined from the measurement of diffraction line intensities of that component only. Optimum conditions to attain maximum accuracy of the doping method are discussed.