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Fourfold anisotropy and structural behavior of epitaxial hcp Co/GaAs(001) thin films

46

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22

References

1995

Year

Abstract

Thin Cr-capped Co films (thickness 50--150 \AA{}) have been grown epitaxially on GaAs(001) single-crystal substrates by molecular-beam epitaxy. In contrast to other investigations, transmission electron diffraction reveals that the epitaxial Co films have a hexagonal-close-packed (hcp) structure with the epitaxial relationships (1\ifmmode\bar\else\textasciimacron\fi{}21\ifmmode\bar\else\textasciimacron\fi{}0)[0001]Co\ensuremath{\parallel}(001)[110]GaAs and (1\ifmmode\bar\else\textasciimacron\fi{}21\ifmmode\bar\else\textasciimacron\fi{}0)[0001]Co\ensuremath{\parallel}(001)[1\ifmmode\bar\else\textasciimacron\fi{}10]GaAs, i.e., the c axis of each crystallite is assigned to either the in-plane [110] or the [1\ifmmode\bar\else\textasciimacron\fi{}10] direction of the GaAs(001) substrate. In-plane magneto-optical Kerr-effect hysteresis loops and Brillouin light-scattering measurements show that the thinnest epitaxial hcp Co film (50 \AA{}) has a dominant fourfold anisotropy with easy axes along the in-plane 〈100〉 directions and that a uniaxial anisotropy becomes dominant with increasing film thickness. We are able to account for the magnetic anisotropy properties of these epitaxial Co films in terms of their oriented hcp microstructure.

References

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