Grazing-incidence x-ray diffraction study of pentacene thin films with the bulk phase structure

Abstract

The structure of pentacene thin films in the bulk phase having interplane spacing of d(001)=1.44nm grown on SiO2 was investigated using grazing-incidence x-ray diffraction. The films were prepared with two different methods: one treated with an organic solvent after vacuum deposition and the other thermally treated. Both films are similar in structure to the single crystal reported by Campbell et al. [Acta Crystallogr. 15, 289 (1962)].