Publication | Closed Access
Measurement of spectral and polarization characteristics of parametric X-rays in a Si crystal
45
Citations
6
References
1989
Year
PhotonicsOptical MaterialsX-ray SpectroscopyPolarization CharacteristicsPhysicsSi CrystalOptical PropertiesEngineeringX-ray DiffractionApplied PhysicsCrystallographySilicon On InsulatorParametric X-raysOptoelectronicsX-ray OpticX-ray Fluorescence
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