Publication | Closed Access
Vacancy defects in (Pb, La)(Zr, Ti)O3 capacitors observed by positron annihilation
50
Citations
11
References
1998
Year
EngineeringPositron Annihilation SpectroscopyO3 CapacitorsDefect TolerancePositron AnnihilationFerroelectric ApplicationMaterials SciencePhysicsCrystalline DefectsOxide ElectronicsDefect FormationVacancy DefectsPlzt Thin FilmsElectrochemistryVepb Depth ProfileLsco Top ElectrodeEnergy CeramicApplied PhysicsCondensed Matter PhysicsFerroelectric MaterialsThin Films
A study of vacancy-related defects in ferroelectric capacitors was performed using a variable energy positron beam (VEPB). Heterostructures of (Pb0.9La0.1)(Zr0.2Ti0.8)O3 (PLZT) ferroelectric with La0.5Sr0.5CoO3 (LSCO) electrodes were deposited by pulsed laser deposition and the effects of oxygen deficiency studied using structures grown with 760 and 1×10−5 Torr oxygen. The VEPB depth profile showed an increase in vacancy-related defects with increased oxygen nonstoichiometry. A study of LSCO and PLZT thin films was also performed. The formation of vacancy clusters in the LSCO top electrode, and VPb−VO defects in the PLZT layer, with increased oxygen deficiency is inferred.
| Year | Citations | |
|---|---|---|
Page 1
Page 1