A noninvasive bunch length monitor for femtosecond electron bunches

Abstract

A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art “bandpass” GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor’s performance.