High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model - Concepedia

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High speed and high accuracy inspection of in-tray laser IC marking using line scan CCD with a new calibration model

24

Citations

8

References

2010

Year

Chern‐Sheng Lin, Jui Tsung Huang, Tzu-Chi Wei, Mau‐Shiun Yeh, Der‐Chin Chen

Optics & Laser Technology

High Accuracy InspectionEngineeringCalibrationLaser ApplicationsLine Scan CcdLaser Processing TechnologyLaser-based SensorInstrumentationLaser FabricationHigh SpeedAutomated Inspection

References

	Year	Citations

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