Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction - Concepedia

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Growth of erbium-silicide films on (100) silicon as characterised by electron microscopy and diffraction

35

Citations

16

References

1997

Year

N. Frangis, J. van Landuyt, Grigoris Kaltsas, A. Travlos, A. G. Nassiopoulos

Journal of Crystal Growth

Materials ScienceMaterials EngineeringEngineeringElectron MicroscopyPhysicsSurface ScienceApplied PhysicsErbium-silicide FilmsSiliceneSemiconductor Device FabricationSilicon On InsulatorEpitaxial GrowthOptoelectronicsThin Film Processing

References

	Year	Citations

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