Publication | Closed Access
A simple analysis of stable domain propagation in the Gunn effect
119
Citations
20
References
1966
Year
Stable Domain PropagationEngineeringSimple AnalysisSemiconductor DeviceElectron PhysicNanoelectronicsAnalytical TreatmentComputational ElectromagneticsCharge Carrier TransportDevice ModelingElectrical EngineeringPhysicsMicroelectronicsApplied PhysicsCondensed Matter PhysicsStable DomainsGunn EffectBias VoltageElectrical Insulation
An analytical treatment of uniformly propagating stable domains is developed for the case when the electrons have a field-independent diffusion coefficient and follow an arbitrary static velocity-field characteristic exhibiting a negative differential resistivity. For any value of the diffusion coefficient the domain velocity is equal to the electron velocity outside the domain and the peak domain field is determined by a dynamic characteristic which is derived from the static characteristic by a simple geometrical construction. In the limit of zero diffusion the domain consists of a depletion layer triangle to which is added a flat-topped region in long, low-resistivity samples at high bias voltages. Numerical results are given for a schematic three-line static characteristic which is representative of gallium arsenide and the variation of the domain parameters with resistivity, sample length and bias voltage is discussed.
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