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Metrological characterization of X-ray diffraction methods at different acquisition geometries for determination of crystallite size in nano-scale materials

Materials ScienceX-ray CrystallographyEngineeringCrystal MaterialNanomaterialsMaterials CharacterizationApplied PhysicsX-ray DiffractionX-ray Diffraction MethodsCrystallite SizeCrystal FormationCrystallographyMicrostructureMetrological Characterization