Dual-Environment Effects on the Oxidation of Metallic Interconnects - Concepedia

Concepedia

Publication | Open Access

Dual-Environment Effects on the Oxidation of Metallic Interconnects

DOI Full Paper Access

44

Citations

4

References

2006

Year

Gordon R. Holcomb, Małgorzata Ziomek-Moroz, Stephen D. Cramer, Bernard S. Covino, Sophie J. Bullard

Journal of Materials Engineering and Performance

Materials ScienceElectrical EngineeringDual-environment EffectsEngineeringElectromigration TechniqueCorrosionOxidation ResistanceElectronic PackagingInterconnect (Integrated Circuits)

References

	Year	Citations

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