Publication | Closed Access
Direct Observation of Barkhausen Avalanche in Co Thin Films
151
Citations
21
References
2003
Year
EngineeringMagnetic ResonanceCritical Exponent TauMagnetoresistanceMagnetismDirect ObservationQuantum MaterialsBarkhausen AvalanchesMagnetic Thin FilmsPulsed Laser DepositionMaterials ScienceBarkhausen AvalanchePhysicsExperimental AnalysisMagnetic MediumSpintronicsFerroelasticsMaterial AnalysisApplied PhysicsCondensed Matter PhysicsThin FilmsMagnetic PropertyCritical Phenomenon
We report direct full-field magneto-optical observations of Barkhausen avalanches in Co polycrystalline thin films at criticality. We provide experimental evidence for the validity of a phenomenological model of the Barkhausen avalanche originally proposed by Cizeau, Zapperi, Durin, and Stanley [Phys. Rev. Lett. 79, 4669 (1997)]], where the model describes a 180 degrees -type flexible domain wall deformed by a localized defect with consideration of long-range dipolar interaction. The Barkhausen jump areas show a power-law scaling distribution with critical exponent tau approximately 1.33 for all the samples having different thickness from 5 to 50 nm, which is in accord with the two-dimensional prediction of the model.
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