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Tailoring interfacial exchange coupling with low-energy ion beam bombardment: Tuning the interface roughness
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Citations
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References
2012
Year
EngineeringInterface RoughnessIon ImplantationNio Surface RoughnessNanoscale ModelingIon BeamIon EmissionMaterials ScienceMaterials EngineeringPhysicsOxide ElectronicsExchange Coupling StrengthInterface PropertySurface ScienceApplied PhysicsNi80fe20/nio Film SystemInterfacial ExchangeInterface StructureBeam Transport SystemInterface Phenomenon
By ascertaining NiO surface roughness in a Ni80Fe20/NiO film system, we were able to correlate the effects of altered interface roughness from low-energy ion-beam bombardment of the NiO layer and the different thermal instabilities in the NiO nanocrystallites. From experiment and by modelling the temperature dependence of the exchange bias field and coercivity, we have found that reducing the interface roughness and changing the interface texture from an irregular to striped conformation enhanced the exchange coupling strength. Our results were in good agreement with recent simulations using the domain state model that incorporated interface mixing.
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