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Characteristics of SnSe and SnSe<sub>2</sub> thin films grown onto polycrystalline SnO<sub>2</sub>‐coated glass substrates
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Citations
20
References
2010
Year
Thin Film PhysicsOptical MaterialsEngineeringGlass SubstratesOptical AbsorptionThin Film Process TechnologyChemical DepositionThin Film ProcessingThin-film TechnologyMaterials ScienceMaterials EngineeringThin Film MaterialsSputtered Tin LayersSurface CharacterizationMaterial AnalysisSurface ScienceApplied PhysicsMaterials CharacterizationThin Film DevicesThin FilmsSnse 2Chemical Vapor Deposition
Abstract Tin selenide thin films have been prepared by selenization of sputtered tin layers and have been analyzed comparatively onto bare and SnO 2 ‐coated glass substrates. In particular, the effects of the selenization temperature and the polycrystalline substrate nature on the stoichiometry and physical properties of the layers were investigated. X‐ray diffraction was used to determine the crystalline phases and their structure, scanning electron microscopy to observe the surface topography, energy‐dispersive X‐ray analysis to establish the film composition, and spectrophotometry to determine the optical absorption, all these properties correlated to the experimental parameters. By using polycrystalline tin oxide coatings it is possible to achieve a significant crystalline enhancement for the SnSe and SnSe 2 phases identified, being the Se:Sn atomic proportion, as well as the optical absorption, highly dependent on the selenization temperature apart from the substrate nature.
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