Control of the defect in the liquid crystal director field on the slit of the patterned vertical alignment cell

Abstract

In this letter the authors studied the method to control the position of the generated defect on the slit of the patterned vertical alignment liquid crystal (LC) cell with dynamic stability. The authors modeled the LC director field with a defect on the slit and proposed an advanced wing pattern with a defect trap to stick the defect outside the active area. This shape can prevent the generation of the defect on the slit in the active area even if the authors increase the operation voltage, so that the LC dynamics on the slit is very stable and optical transmittance becomes higher.