Study of electrically active defects in n-GaN layer - Concepedia

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Study of electrically active defects in n-GaN layer

18

Citations

10

References

2001

Year

Chew Beng Soh, Dongzhi Chi, A. Ramam, H.F. Lim, S. J. Chua

Materials Science in Semiconductor Processing

Electrical EngineeringEngineeringApplied PhysicsGan Power DeviceActive DefectsCategoryiii-v Semiconductor

References

	Year	Citations

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